NanoESCA

Welcome

The analysis of chemical and electronic states in complex and nanostructured material systems requires electron spectroscopy to be carried out with nanometer lateral resolution, i.e. spectronanoscopy. This goal is achieved in  NanoESCA instrument by combining a parallel imaging photoelectron emission microscope with an appropriate energy filter. This instrument has a particular emphasis on the spectroscopic aspects and enables laterally resolved photoelectron spectroscopy from the VUV up into the hard x-ray regime.

The design includes a non-magnetic, electrostatic PEEM lens and a double-pass hemispherical analyser. Rapid PEEM survey imaging (< 50 nm resolution) can be used to locate features, whilst its lateral resolution in imaging ESCA of 650 nm in the laboratory and 150 nm at the Synchrotron are simply unique.

Research | Publications

Imaging X-ray Photoelectron Spectroscopy (Imaging ESCA mode)

The main lens has a large angular acceptance and projects the magnified image into the analyser. 
The image information is energy filtered by the highly aberration correcting IDEA and projected onto a MCP/screen stack for CCD camera based date acqusition. 
 

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Small Spot Spectroscopy mode

High sensitivity single-spot spectroscopy using a Channeltron® after the first energy analyser for quantitative elemental analysis.

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PEEM mode

Survey imaging with a large field of view, resolution down to 50 nm and real-time imaging of the surface. The lens projects a magnified image of the sample directly onto the PEEM screen.

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The concept of NanoESCA

• IDEA aberration-corrected band pass energy filter
• Compensation of first analyser errors by second analyser allows large slits (1-2mm) and small pass energy
• No intermixing of spatial and energy information
• Result: high transmission imaging energy analyser  
 

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Proposal Submission

We invite users and collaborators to discuss their proposals with the beamline local contacts well in advance before the submission deadline. This is crucial for a careful assessment of the experiment feasibility and may lead to improvements in the proposed experimental plan. In a restricted number of cases, when doubts arise about the suitability of your samples or the planned measurements are too close to the microscope resolution limit, it may be possible for you to arrange a test.

Beamline is open

From January 2012 NanoESCA beamline is opened to Elettra general users (20% of the total beamtime availablen Nanospectroscopy). All proposals requiring this instrument must be submitted on the Virtual Unified Office indicating NanoESCA as beamline.